2nd Edition
by Bob B. He (Author)
An indispensable resource for researchers and students in materials science, chemistry, physics, and pharmaceuticals
Written
by one of the pioneers of 2D X-Ray Diffraction, this updated and
expanded edition of the definitive text in the field provides
comprehensive coverage of the fundamentals of that analytical method, as
well as state-of-the art experimental methods and applications.
Geometry convention, x-ray source and optics, two-dimensional detectors,
diffraction data interpretation, and configurations for various
applications, such as phase identification, texture, stress,
microstructure analysis, crystallinity, thin film analysis, and
combinatorial screening are all covered in detail. Numerous experimental
examples in materials research, manufacture, and pharmaceuticals are
provided throughout.
Two-dimensional x-ray diffraction is the
ideal, non-destructive analytical method for examining samples of all
kinds including metals, polymers, ceramics, semiconductors, thin films,
coatings, paints, biomaterials, composites, and more. Two-Dimensional X-Ray Diffraction, Second Edition is
an up-to-date resource for understanding how the latest 2D detectors
are integrated into diffractometers, how to get the best data using the
2D detector for diffraction, and how to interpret this data. All those
desirous of setting up a 2D diffraction in their own laboratories will
find the author’s coverage of the physical principles, projection
geometry, and mathematical derivations extremely helpful.
- Features
new contents in all chapters with most figures in full color to reveal
more details in illustrations and diffraction patterns
- Covers
the recent advances in detector technology and 2D data collection
strategies that have led to dramatic increases in the use of
two-dimensional detectors for x-ray diffraction
- Provides
in-depth coverage of new innovations in x-ray sources, optics, system
configurations, applications and data evaluation algorithms
- Contains new methods and experimental examples in stress, texture, crystal size, crystal orientation and thin film analysis
Two-Dimensional X-Ray Diffraction, Second Edition
is an important working resource for industrial and academic
researchers and developers in materials science, chemistry, physics,
pharmaceuticals, and all those who use x-ray diffraction as a
characterization method. Users of all levels, instrument technicians and
X-ray laboratory managers, as well as instrument developers, will want
to have it on hand.